The is the User Manual for Valkyrie2544. Valkyrie2544 is a PC application that enables you to perform advanced network tests according to the RFC 2544 specification using one or more of the Xena Valkyrie layer 2-3 test equipment chassis.
The Valkyrie2544 application features the following capabilities:
- Enables the user to create, edit and execute test configurations using Xena Networks test equipment in accordance with RFC 2544.
- Full support for the 4 test-types specified in RFC 2544.
- Ability to partially enable one or more of the test-types.
- Support for multiple ValkyrieBay and ValkyrieCompact test chassis.
- Support for different network topologies and traffic flow directions.
- Support for both layer 2 and layer 3 testing.
- Support for either IPv4 or IPv6.
- Ability to flexibly define the protocol layers supported by the test (Ethernet, Customer and Service VLANs, IP and UDP).
- Ability to specify different protocol headers for each port.
- Ability to set modifiers on virtually any protocol field in the protocol headers using a Wireshark-like tree view.
- Support for asymmetric port rates and DUT throughput rates. The Throughput test can be configured to either measure the least common throughput rate or measure a per-port rate.
- Test reports can be created in either PDF, XML or CSV format or any combination thereof.
- Extensive configuration options to fine-tune the tests.
Installation on Windows
Valkyrie2544 is a standard Windows .NET application supporting Windows XP (SP3) and all later Windows versions. It requires Microsoft .NET version 4.0.
After installation you can find a shortcut to the application either in the Start -> Programs -> Xena Networks menu or (if you have selected this during setup) on your desktop.
The application is installed as part of the Xena software release package which can be obtained here.
Refer to this page for details on support for Linux.
This section provides explanations for the terminology used by the Valkyrie2544.
||A “test run” (or simply “run”) denotes the part of the test configuration that is associated with a single test-type and a single packet size. This concept is used for the purpose of progress reporting. A test configuration that specifies the use of e.g. 5 packet sizes and has enabled 3 of the possible 4 test-types will thus consist of 5*3 = 15 runs.
||Each test-type can be configured to repeat the test runs associated with the test-type a number of times. Each of these additional runs is called an iteration.
||A “trial” denotes a single execution of an iteration.
||Denotes one of the the four types of tests according to RFC 2544: Throughput, Latency (and Jitter),
Loss and Back-to-Back (a.k.a. Burst).
||A topology where each port is associated with exactly one other peer port. The ports must be associated with opposing EAST/WEST groups. A test configuration can contain several port pairs.
The transmit and receive roles of the two ports are determined by the Direction setting.
||A topology where each port is associated with either the EAST or the WEST group. Each port in the EAST group will then communicate with all ports in the WEST group, and vice versa.There are thus no direct relation between ports like there are for the Pairs topology.
The transmit and receive roles of the ports are determined by the Direction setting.
||A topology where all ports communicate with each other. The direction will always be bidirectional and the EAST/WEST group attribute is not used.
||Denotes the direction of the traffic flows in relation to the group definitions. The direction can be either unidirectional or bidirectional. Unidirectional flows can be either EAST-to-WEST or WEST-to-EAST.
This section describes the test available in Valkyrie2544. They closely follow the definition in the RFC 2544 specification.
The throughput test is an iterative test that attempts to find the throughput for a Device Under Test (DUT). RFC 1242 defines the throughput as “The maximum rate at which none of the offered frames are dropped by the device”.
The test uses a binary search algorithm to locate the throughput rate. One iteration of the test will produce a single test result.
The latency/jitter test is also a rate sweep test that attempts to determine the latency and jitter for a DUT throughout a defined range of input data rates. RFC 1242 broadly defines latency as the time it takes for a frame to traverse the DUT, but the precise definition depends on the type of forwarding used in the DUT. Latency is also known as the “Frame Transfer Delay” (FTD). Jitter is not defined in this RFC but is defined as the variation in latency over time. It is also known as the “Frame Delay Variance” (FDV).
The test measures the average, maximum and minimum latency and jitter values at a series of input rates defined by an initial value a, maximum value and a step value. One iteration of the test will produce a test result for each rate in the series.
Frame Loss Test
The loss test is a rate sweep test that attempts to determine the frame loss rate for a DUT throughout a defined range of input data rates. RFC 1242 defines the loss as the “percentage of frames that should have been forwarded by a network device under steady state (constant) load that were not forwarded due to lack of resources”.
The test measures the frame loss at a series of input rates defined by an initial value a, maximum value and a step value. One iteration of the test will produce a test result for each rate in the series.
The Back-to-Back test is a combination of an iterative test and a rate sweep test that characterizes the ability of a DUT to process back-to-back frames at various rates. RFC 1242 defines back-to-back frames as “fixed length frames presented at a rate such that there is the minimum legal separation for a given medium between frames over a short to medium period of time, starting from an idle state”. The test attempts to locate the maximum number of frames that can be sent back-to-back at a given rate without any frame loss. This is also known as the “burst size”.
The test uses a binary search algorithm to locate the burst size at a given rate. One iteration of the test will produce a single test result for each input rate used.
Detailed Information about Valkyrie2544
The following pages contain more information about the Valkyrie2544 application.
Please refer to this page which contains a few examples to get you started using the Valkyrie2544.
Please refer to this page for a detailed explanation of all properties in the Valkyrie2544.
Please refer to this page for further details about troubleshooting the Valkyrie2544.